In a previous blog post “How to prepare metal alloy samples for analysis by ICP-OES or ICP-MS”, my colleague Sue Evans Norris described the traditional methods for the sample preparation of metal alloys by ICP. At ARMI, we are always looking for ways to improve the status quo and recently discovered a new sample preparation technology for the rapid digestion of metal alloys using short-wave infrared radiation. This technology, promoted by a Canadian company called ColdBlock, claims their instrument can digest metal alloys faster than current techniques while eliminating the need for dangerous acids such as hydrofluoric and perchloric acid.
LGC ARMI announces the release of a new set of Nickel alloy Certified Reference Materials.
- IARM 25D - Alloy 20
- IARM 51D- Alloy 400
- IARM 52D - Alloy K500
- IARM 157D - AL6XN
- IARM 239C- Alloy 225
As always these reference materials are available in three different forms depending on your analytical technique; 38mm diamater x 3mm thickness for XRF, 38mm diameter x 19mm thickness for arc spark OES or as chips for analysis by ICP or AA.
Want to learn more about thes reference materials ? You can download the certificates of analysis using th hyperlinks above and check out our new products page for information on these and other recently released products.
Set Up Samples (SUS)
Set up Samples were described in a previous blog post by Charlie Hodges entitled “How to Choose the Correct Aluminum Reference Material for Your Application” but in general, they are homogeneous reference materials used for daily drift correction or standardization or slope correction, typically for arc spark optical emission spectroscopy. These materials are homogeneous and are usually provided with a certificate of analysis showing the approximate chemical composition but differ from a certified reference material in that there is no supporting statistical data. These types of materials offer a low cost alternative to consuming expensive CRM’s for daily drift correction.
Its college graduation season here in the US and we here at ARMI are proud to announce the graduation of out next batch of certified reference materials for the metals industry. The graduates are IARM 54G, IARM 56H and IARM 271B.
54G is a 625 Nickel alloy and replaces 54F. 56H is a 718 Nickel alloy and replaces 54G. 271B is a 5-2.5 Titanium alloy.
XRF (X-ray Fluorescence Spectrometry) is a chemical analysis tool commonly used for the quality control of raw materials and finished products in many industries including cement, mining and industrial minerals. The capabilities of XRF instrumentation have advanced significantly in the past decade in both sensitivity and stability such that they are no longer the most important source of error in an analysis. Sample preparation is now by far the most significant source of error in the analysis of materials by XRF. Viewed from this perspective, it is clear that high quality sample preparation techniques and practices are the key to achieving consistent and reliable analytical results.
LGC ARMI is pleased to announce the release of two new standards, IARM 282A and IARM 4F.
These reference materials are available in three different forms depending on your analytical technique; 38mm diamater x 3mm thickness for XRF, 38mm diameter x 19mm thickness for arc spark OES or as chips for analysis by ICP or AA.
XRF or X-Ray Fluorescence spectrometry is an elegant chemical analysis technique used frequently in many industries for quality control of materials and R&D. Despite its widespread use in industry, it is an analytical technique rarely encountered by students in colleges and universities, especially in the United States. The rare exceptions to this are the geology departments in a few institutions where the technique is still used for geochemical studies.
Sample Preparation for XRF Analysis
Sample Preparation for XRF Analysis