CRM Solutions

Set Up Samples (SUS)

 Set up Samples were described in a previous blog post by Charlie Hodges entitled “How to Choose the Correct Aluminum Reference Material for Your Application” but in general, they are homogeneous reference materials used for daily drift correction or standardization or slope correction, typically for arc spark optical emission spectroscopy.  These materials are homogeneous and are usually provided with a certificate of analysis showing the approximate chemical composition but differ from a certified reference material in that there is no supporting statistical data.   These types of materials offer a low cost alternative to consuming expensive CRM’s for daily drift correction.

Its college graduation season here in the US and we here at ARMI are proud to announce the graduation of out next batch of certified reference materials for the metals industry.  The graduates are  IARM 54G, IARM 56H and IARM 271B.

54G is a 625 Nickel alloy and replaces 54F.  56H is a 718 Nickel alloy and replaces 54G.   271B is a 5-2.5 Titanium alloy.

Introduction

XRF (X-ray Fluorescence Spectrometry) is a chemical analysis tool commonly used for the quality control of raw materials and finished products in many industries including cement, mining and industrial minerals.  The capabilities of XRF instrumentation have advanced significantly in the past decade in both sensitivity and stability such that they are no longer the most important source of error in an analysis.  Sample preparation is now by far the most significant source of error in the analysis of materials by XRF.  Viewed from this perspective, it is clear that high quality sample preparation techniques and practices are the key to achieving consistent and reliable analytical results.

LGC ARMI is pleased to announce the release of two new standards, IARM 282A and IARM 4F.    

These reference materials are available in three different forms depending on your analytical technique; 38mm diamater x 3mm thickness for XRF, 38mm diameter x 19mm thickness for arc spark OES or as chips for analysis by ICP or AA.

Download the Certificates  

XRF or X-Ray Fluorescence spectrometry is an elegant chemical analysis technique used frequently in many industries for quality control of materials and R&D.  Despite its widespread use in industry, it is an analytical technique rarely encountered by students in colleges and universities, especially in the United States.   The rare exceptions to this are the geology departments in a few institutions where the technique is still used for geochemical studies. 

Sample Preparation for XRF Analysis

Sample Preparation for XRF Analysis

XRF or X-Ray Fluorescence spectrometry is an elegant chemical analysis technique used frequently in many industries for quality control of materials and R&D.  Despite its widespread use in industry, it is an analytical technique rarely encountered by students in colleges and universities, especially in the United States.   The rare exceptions to this are the geology departments in a few institutions where the technique is still used for geochemical studies.