CRM Solutions

Reducing Contamination in the Preparation of Metal Alloys for Analysis by ICP

[fa icon="calendar'] Jul 31, 2017 8:00:00 AM / by Susan J. Evans Norris posted in Sample Preparation, metal alloys, ICP

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We have received several questions regarding the best approach to cleaning solid samples and standards that have been prepared as chips for analysis by a total dissolution technique, such as ICP-OES or ICP-MS. Let’s first discuss common approaches for sampling, and then appropriate methodologies for ensuring chips are clean and free from contamination.

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How to Prepare Metal Alloy Samples for Analysis by ICP-OES or ICP-MS

[fa icon="calendar'] Jun 23, 2017 5:57:49 PM / by Susan J. Evans Norris posted in Sample Preparation, metal alloys, ICP

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Metal alloys are commonly analyzed using solid sampling techniques such as Arc/spark optical emission spectroscopy (A/S OES), X-ray Fluorescence Spectroscopy (both Energy Dispersive (ED-XRF) and Wavelength Dispersive (WD-XRF)), and X-ray Diffraction (XRD). These techniques provide fast analysis with little or no sample preparation required, and can be provided as portable units, and in the case of XRF, hand-held units, for maximum flexibility. These techniques also are considered non-destructive in that the metal alloy is left largely unchanged after analysis, and is available for further testing or archiving.

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Improve your ICP-OES Performance by using an Internal Standard

[fa icon="calendar'] Jun 2, 2017 12:40:33 PM / by Susan J. Evans Norris posted in Certified Reference Materials, metal alloys, ICP

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The use of an Internal Standard (IS) can significantly improve both the accuracy and precision of your ICP-OES analytical results. This post addresses:  how internal standards work, how to select an appropriate IS element, and how this methodology can be easily incorporated into your lab’s analytical procedures.

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New Product Release: IARM 282A and 4F

[fa icon="calendar'] Apr 12, 2017 12:43:49 PM / by Dave Coler posted in XRF, metal alloys, stainless steel alloys, Haynes alloys

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LGC ARMI is pleased to announce the release of two new standards, IARM 282A and IARM 4F.    

These reference materials are available in three different forms depending on your analytical technique; 38mm diamater x 3mm thickness for XRF, 38mm diameter x 19mm thickness for arc spark OES or as chips for analysis by ICP or AA.

Download the Certificates  IARM 282A 

IARM 4F

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