Notes
Slide Show
Outline
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Overview

  • Powerful alternative to sequential ICP and FAA spectrometers


  • High analyses speed


  • Simultaneous measurement of the complete spectrum


  • Factory methods for environmental and industrial applications
  • Minimal installation and training requirements


  • Compact design enables seamless integration into the laboratory.


  • Excellent price-performance ratio


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OPTICAL SYSTEM
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OPTIC
  • ORCA (Optimized Rowland Circle Alignment) Polychromator
    • Rugged hollow section construction, designed for direct thermal stabilization
    • 15 pre-aligned externally mounted detector units
    • Continuous wavelength coverage from 175 nm to 520 nm
      • Additional detectors for Na, K and Li
    •  Argon purged (< 1 l/min), optional Nitrogen purge available


    • Complete spectrum capture with every measurement
    • Spectrum capture incl. processing within < 3 sec
    • Few optical surfaces, reduced stray light levels
    • Class winning UV performance
    • Lowest operating cost (can also be operated in air)
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DETECTOR
  • Proven Technology
    • Outstanding reliability
    • Failure rate over the last 7 years (22000 chips): <0.1%
  • Requires no On-Chip cooling
    • Thermally stabilized (through GENESIS OPTIC) at 30 °C
    • No detector icing
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Design Concept
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READOUT SYSTEM
  • Ultra High Speed
    • Shortest Integration 1 msec
    • Full spectrum processing (read-out) in 2 msec
    • Complete sample analysis in < 5 min (preflush + 2 replicates)


  • Dynamic Range up to 8 orders of magnitude
    • Blooming is negligible
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ICAL (Intelligent Calibration)
  • Permanent control of the GENESIS OPTIC
    • System prompted corrective action in the case of deviations beyond the specified limits
  • Normalization of the resolution, the wavelength- and the intensity scale
    • Standardization of the GENESIS OPTIC and all methods by means of a single sample

    • No time consuming standardization of individual methods required anymore
    • Optimum system performance, anytime
    • Higher level of safety
    • Possibility for factory calibrated method packages
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ICAL
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Product Highlights Factory Calibration Packages
  • Factory calibration packages available for common environmental and industrial applications
      • Water
      • Waste Water
      • Industrial Waste Water
      • Soil
      • Sewage Sludge
      • Filter Dust
      • Wear Metals in Oil
      • Additives in Oil
    • Compliant national and international norms
    • Package includes sample introduction system and documentation


    • No further method development required
    • Instrument can be delivered Plug&Play
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Benefits for the Customer (compared to other ICP Systems)

  • Compared to PMT ICP-OES, the GENESIS offers more flexibility and the possibility to measure simultaneously at a similar price
    • Considerable time saving for the same price

  • Compared to “Mid Range“ CCD ICP, the GENESIS SOP offers a similar performance level at a lower price


  • Employing Plug & Play the instrument is easy to use
    • Time required for installation and training is drastically reduced

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Benefits for the Customer (compared to FAA)

  • Although higher in price the GENESIS SOP can be quickly amortized
    • Drastically reduced analysis times per sample
    • Increased productivity
      • If 16 Elements and 100 samples are analysed per 8h the additional costs for an “Entry Level“ ICP (e.g. € 20k) are amortized within one year.
      • Independent from the no. of elements the “Entry Level“ ICP can measure approx. 160 samples per 8h

  • Unattended Operation!
    • Out of safety reasons Flame AA Systems cannot be operated without attention. Since no flammable gases are used, ICP-OES can be operated 24h per day
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Improved Performance and Productivity for Optical ICP Analysis Using an Innovative Optical Design.
  • High Resolution ICP-CCD Spectrometer for the Most Demanding Elemental Analysis Requirements
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Contents
  • Instrument
  • Surpassing Performance Limits  -  The Difference  -  Highlights
  • Technology
  • Housing  -  Optical system  -  UV-PLUS  -  Detector and Readout System  -
  • Excitation  -  Plasma Interface  -  Sample introduction
  • Software
  • ICAL  -  SMART ANALYZER VISION  -  Automation
  • Accessories
  • Sample introduction systems  -  Factory-calibrated method packages
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Surpassing Performance Limits
  • Conventional ICP analysis can often reach its limits for especially demanding applications. An Optimized Rowland Circle Alignment (ORCA) offers optimum capability and flexibility for these analytical challenges. Innovative components with spectacular performance characteristics overcome contemporary barriers with plenty of power in reserve for complex tasks in industry, environmental protection and research.
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The Difference
  • Its appearance alone sends out a definite signal: The system housing is different from conventional ICP spectrometers. The prominent left side of the instrument houses the unique optical system – a patented major development with unbeatable resolution, accuracy and stability.
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Highlights
  • New ICP performance class for complex analytical tasks
  • Axial or radial plasma observation
  • Sample introduction system with automatic positioning
  • Stable plasma conditions due to the robust free-running generator
  • Unique optical system with excellent resolution
  • Extended spectral range from 130-770 nm for perfect line selection
  • Low maintenance UV system with minimal operating cost
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Housing
  • The compact instrument fits on every ordinary lab bench. Housing and fluid paths are fitted with a chemical resistant coating. All components and connections are accessible – without moving the instrument – from the front and sides, simplifying maintenance.
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Optical System Overview
  • The advanced SPECTRO ARCOS optical system with optimized Paschen-Runge assembly (ORCA) and aluminum half-shell technology represents a milestone in ICP analysis.
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Optical System Highlights
  • Recording of the complete relevant spectrum from 130 to 770 nm
  • Never before seen resolution of 8.5 picometer in the important range of 130 to 340 nm and 15 picometer for higher wavelengths
  • Access to additional wavelengths for the halogens
  • Many new lines for ultra trace determination
  • Interference-free emission lines for complex matrices
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Optical System Schematics
  • Brilliantly constructed and analytically superior: The
    design of the
    patented optical system
  • 1 - Entrance slit
  • 2 - Grating 3600 g/mm
  • 3 - Grating 1800 g/mm
  • 4 - Grating 3600 g/mm
  • 5 - Virtual Entrance slit
  • 6 - CCD Arrays 130-175 nm
  • 7 - CCD Arrays 175-340 nm
  • 8 - CCD Arrays 340-770 nm
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UV-PLUS
  • No contamination of the optical components
  • Excellent long-term stability
  • Dramatic reduction of operating costs
  • In the patented UV-PLUS method, the optical system chamber is filled once with argon. The argon is circulated with a small membrane pump through a cleaning device.
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Detector and Readout System
  • 32 linear CCD detectors
  • Thermally stabilized together with the complete optical system instead of special minus temperature cooling
  • Dedicated digital signal processor for every CCD array
  • High readout speed, large dynamic range, no blooming effects
  • Processing of transient signals with a frequency of up to 10 Hz
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Excitation
  • A completely revised generator with air-cooling, a 5 kW ceramic tube and a solid-state power supply is applied in the SPECTRO ARCOS
  • Robust, free-running oscillator
  • Stable plasma power even for strongly varying loads
  • Cost saving standby mode with lower power and argon consumption
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Plasma Interface
  • Depending on the application, one of two different technologies is utilized to view the plasma.
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Optical Plasma Interface (OPI)
  • Axial plasma observation with the patented Optical Plasma Interface (OPI) for the analysis of traces
  • 1 - Light path to optical system
  • 2 - Water-cooled plasma interface
  • 3 - Argon supply
  • 4 - Plume
  • 5 - Analytical zone
  • 6 - RF coil
  • 7 - Plasma torch
  • 8 - Sample flow
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Side-on Plasma-Interface (SPI)
  • Radial plasma observation with the Side-on Plasma Interface (SPI) for accuracy and precision at higher concentrations and a superior tolerance for high saline and organic fractions as well as suspensions and slurries.
  • 1 - Light path to optical system
  • 2 - Excitation zone
  • 3 - Emission zone
  • 4 - Recombination zone
  • 5 - RF coil
  • 6 - Plasma torch
  • 7 - Sample flow
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ICAL Intelligent Calibration Logic
  • The patented ICAL logic system continuously monitors the operating state of the SPECTRO ARCOS. If changes are detected, a normalization that consists of the automatic or manual measurement of a single ICAL sample is started ensuring that the instrument is always in an optimal state of operation.
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SMART ANALYZER VISION
  • Quickly and intuitively use the instrument functions
  • Easy integration into a LIMS
  • Fully novel possibilities for new evaluation of stored measurement results with modified parameters
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Factory-calibrated method packages
  • Additionally, factory calibrated, norm conforming “Plug and Analyze” method packages for typical industrial and environmental applications are available.
  • Conforming to national and international standards
  • Can be used out of the box without any further work
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Factory-calibrated method packages Examples
  • Each package includes a suitable sample introduction system, extensive documentation and a sample preparation guideline. For example, packages are available for
  • Water / waste water
  • Industrial waste water
  • Soil
  • Sewage sludge
  • Filter dust
  • Additives and wear metals in oil