1	Glow Discharge MS, an affordable technique for the lab Meike Hamester and Lothar Rottmann Thermo Electron (Bremen)
2	Bremen - Germany
3	Thermo Electron (Bremen)
4	Thermo Bremen Manufacturing
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6	Glow Discharge Mass Spectrometry – History Gas discharge ion sources are used since the early days of mass spectrometry by pioneers like Joseph John Thomson Francis Aston Arthur J. Dempster Problem with gas discharge ion sources: interfacing HV to mass spectrometer GD-MS in mid 80‘s as technique for direct trace analysis of solid samples First commercial instrument launched 1985 Successful instrument VG9000
7	Finnigan Element GD It´s time to reinvent GD-MS… …based on proven HR-ICP-MS Finnigan Element2 …for routine analysis
8	Worldwide 350 ELEMENT HR ICP-MS
9	Principle components of a SF ICP-MS
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11	Components of the Finnigan Element GD
12	The self-sustaining DC glow discharge plasma
13	GD Ion source
14	Finnigan Element GD – Sample Holder Flat samples Sample size Max. Ø 70 mm, 40 mm Height Min. Ø 22 mm Unloading and reloading of the sample in less than 1 minute
15	Changing samples (1)
16	Changing samples (2)
17	Finnigan Element GD – Ion Source
18	Controlled Sample Cooling Peltier cooled cathode Stable temperature at the sputtered sample area Cooling of sample with low melting point Heating of sample for outgasing e.g. pressed powders Sample holder for small samples with additional cooling from rear side
19	Sample surface quality In a ‘normal’ GRIMM type design the sample seals the ion source vacuum i.e. the sample has to be ‘perfectly’ flat Finnigan Element GD: Vacuum seal at the sample holder i.e. independent from sample flatness
20	Interface to Mass Analyzer Extract ions from the plasma into the mass analyzer Interface at ground potential Cone Separation of ion source region (~ 1 mbar) from first analyzer chamber (~ 10^-3 mbar) Extraction of ions into mass analyzer Easy access for removal or cleaning of the cone Valve behind cone to maintain analyzer vacuum during sample change
21	Magnetic sector
22	Why high resolution ? More interference compared to ICP ! High Selectivity
23	Nickel Alloys: Sn119 (HR) zoom
24	Slit system - Resolution
25	Slit System - Easy slit exchange
26	Detection System
27	Finnigan ELEMENT GD Analog/Counting
28	Automatic switch to Faraday Detector
29	Ion Trajectories SEM - Faraday
30	Dynamic Range Finnigan ELEMENT GD
31	Finnigan Element GD Detection System
32	Detection System – Triple Mode (NIST 1761)
33	Finnigan ELEMENT XR Cross Calibration Mass independent cross calibration e.g. Argon Fast 3 s for ACF and FCF determination Reliable automatic user independent
34	Filter Lens GD: Improved Abundance Sensitivity
35	Element GD - Software Optimized for the needs of routine work Effortless tuning of instrument parameters Intuitive and easy creation of methods and analysis sequences Real time display of spectra, time resolved data and results Automatic data export to LIMS systems Sequence import from LIMS (XML, ASCII) Easy network data transfer as well as remote control possibilities Microsoft® Windows® XP Operating System
36	Sensitivity (Medium Resolution R ≥ 4000) ⁶³Cu Copper sample
37	Signal Stability (Cu, 350 mL·min^-1 , 850 V, 55 mA)
38	Stability IBR (Cu, 350 mL·min^-1 , 850 V, 55 mA)
39	Accuracy (BCR Copper standard CRM 075) *M. Kasik, C.Venzago, R. Dorka, J. Anal. At. Spectrom. 2003 (18) 603-611 Average of 8 labs SD
40	Reproducibility (5 Pieces of AgCu sheet)
41	Speed: (Cu 5 N semi-quantitative survey analysis)
42	Detection Power (Th in Copper)
43	Sputter Crater – Depth profiling
44	Finnigan Element GD GD-MS designed for routine operation High sensitivity > 10¹⁰ cps (1.6^-9A) total ion current @R=4000 Cu matrix (at LR about 10x higher signal intensity) Low Detection Limits (e.g. Th ~ 5 ppt in Cu) Excellent Reproducibility Easy to use
45	Plasma Winter Conference 2005 Budapest Thermo (Bremen) has launched 2 new products in Budapest: ELEMENT GD ELEMENT XR
46	"0.2 cps to 1x10¹²cps" 0.2 cps to 1x10¹²cps complete analysis from ultra-trace to matrix Minimum integration time: counting: 0.1 ms analog: 1 ms Faraday: 1 ms No decay time with Faraday detection system Due to integration circuit Automatic switching between detection modes no preset - < 1 ms to Faraday detection Automatic cross calibration