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ILAP '08 - ILAP '07 - ILAP '06 ILAP '05 - ILAP '04 - ILAP '03
The ILAP '08 Conference was held Oct. 08-10, 2007 at The Vail Marriot Spa & Resort in Vail Colorado. The meeting was extremely well attended.
ILAP '08 Presentations
ILAP Status and Accomplishments in 2007/2008 - Daniel Geist, Analytical Reference Materials International
NIST Standards Development Report, & NIST’s Free-Cutting Brass (SRM 1124) Project - John Sieber, NIST
New Reference Materials for Refined / Electrowon Copper - John Sieber, NIST
A Summary of Laser Ablation ICP-MS Methods: The Good, the Bad and the Ugly - Alan Koenig, USGS – Mineral Resources Team
REACH - What is It and Why Should I Care? - Gary Beck, ATI Wah Chang
Applications of ICPMS in a Production Laboratory - Fergus Keenan, Thermo Fisher Scientific
Measurement Uncertainty and Analytical Decision in AES Spectrometry - Edmund Halász, Thermo Fisher Scientific
Maximizing the Value of the Laboratory Accreditation Process - Randy Kunish
GDAES: Method, Calibration & Performance for Bulk and Quant. Depth Profile Analysis - Charlie Maul, LECO Corporation
Trace Element Analysis of High-Purity Nickel Using a New DCA-AES Echelle Spectrometer - Garry Kunselman, Teledyne Instruments Leeman Labs
Haynes Capabilities for Production of Calibration Standards for Nickel & Cobalt Alloys - Anil Joshi, Haynes International
Latest Advancements in Metal Analysis - Wayne Vereb, Spectro Analytical Instruments, Inc.
The Advantages and Benefits of SDD for Handheld XRF Analyzers - Charles Johnson, Thermo Fisher Scientific (Niton Analyzers)
The ILAP '07 Conference was held July 25-27, 2007 at The Great Divide Lodge in Breckenridge Colorado. The meeting was extremely well attended.
ILAP '07 Presentations
ILAP Status and Accomplishments in 2006/2007 - Daniel Geist, Analytical Reference Materials International
LA-ICPMS: New (and Old) Directions and Possibilities for Challenging Samples - Alan Koenig, USGS - Mineral Resources Team
Improved Performance and Productivity for ICP Analysis by an Innovative Optical Design - Dion Tsourides, Spectro AI, Inc.
Current State of PT activities and CRM system in Chinese Metallurgical Industry - Wang Haizhou, China NIL Research Center for PT
Generations & Transformations, a Glimpse of What's New - Jim Pasmore, Thermo Scientific - Niton Analyzers
Working Together - Maximizing the Value of the Laboratory Accreditation Process - Dave Luoni, Performance Review Institute
An impending development regarding ANSI and ISO REMCO - Bob Watters, NIST - Measurement Services
ASTM E01 - Analytical Chemistry for Metals, PT Programs and ILS Programs - Tom O’Toole, ASTM International
ASTM E01 - A Cooperative Partnership for Analytical Method Development - Carroll Davis, Alcoa
Sample Preparation - Part of Your Spectrometer Performance - Rolf Breitlander, Breitlander GmbH
Can small really be as good as big? - Debbie Schatzlein, Thermo Scientific - Niton Analyzers
OPA-Novel Statistic Characterization of Chemical Compositions and its States in Metals - Wang Haizhou, China NIL Research Center for PT
Dilution by Weight - Improved Accuracies and Cost Efficiencies for Digestions - Alexis Puerta, IMR Test Labs
Ni Base Single Crystal Super-Alloys - Wayne Brege, C-M Group
HR-Glow Discharge MS: An Overview on How and Where it is Applied - Richard Balamut, EAG LLC, SHIVA Technologies
The ILAP '06 Conference was held August 7-11, 2006 at The Winter Park Mountain Lodge in Winter Park, CO. The meeting was extremely well attended.
ILAP '06 Presentations
ILAP Status and Accomplishments in 2005/2006
- Daniel Geist, ARMI
Laser Ablation ICP-MS, New (and Old) Directions and Capabilities for Challenging Samples
- Alan Koenig, USGS
Matrix-Independent Analysis of Minor Alloying Elements in Nickel
- Anil Joshi, Haynes International, Inc.
The Changing Face of Portable XRF
- Jim Pasmore, NITON Analyzers
Current Trends in Substance Regulations, New Laws and Standards Activities
- Timothy McGrady, Serious Science
Applications of ICPMS in a Production Laboratory
- Ruth Wolf, USGS
A Statistical Approach to Solution Standards Management
- Juris Sarins, Sipi Metals Corp.
Advanced Capabilities of the Shimadzu PDA-7000 AES
- Ken Suddaby, Canalytical
EDXRD - New Technology
- Carl Cork, Compass Engineering
The ILAP '05 Conference was held July 27 - 29, 2005 at The Double Hotel & Conference Center at Cripple Creek, CO. The meeting was extremely well attended.
ILAP '05 Presentations
ILAP program status and accomplishments in 2004/2005 - Daniel Geist, ARMI
ICP-MS analysis and where it fits in the Analytical Lab - Alan Koenig, USGS
Glow Discharge MS, an Affordable Technique for the Lab - Meike Hamester, Thermo Electron
Laser Ablation ICP-MS an Evolving Technique for the Metals Lab - Alan Koenig, USGS
Latest Advancements in Portable X-Ray Technology - Jim Pasmore, Niton
One Hundred & Fourteen Years of Gold Mining - David Vardiman, CC & Victor Mining Co
EU Directives & ASTM F40 on Declarable Substances in Materials - Tim McGrady, IMR Testing
Heavy Elements in Plastic, Multi-Element Reference Samples - Stan Piorek, MAT LLC
Lab Accreditation, Present, and Future Scopes - David Luoni, Performance Review Institute
Testing tips for Bi in Lead-Free Alloys - Juris Sarins, Sipi Metals & Lee Dilks, Lab Testing
Matrix-independent analysis of minor alloying elements - Dave McAnallen, Huntington Alloys
Tour of the Victor Mine - David Vardiman, CC & Victor Mining Co
The ILAP '04 Conference was held July 28 - 30, 2004 at The Steamboat Grand Hotel at Steamboat, CO.
ILAP '04 Presentations
ILAP program status and accomplishments in 2003/2004 - Daniel Geist, ARMI
Small lot production capabilities for CRM's - Rick Corn, David McAnallen, Huntington Alloys
GDS applications & where they fit in the analytical loop - Charlie Maul, LECO
Automatic Fusion Instrumentation - Rolf Breitlander, Breitlander GmbH
Cobalt futures, Rene 125, 8h, Stellite 21 - Wayne Brege, Cannon Muskegon
Recent Developments in Miniaturized Portable XRF Technology - Jim Pasmore, NITON
NIST SRM Status Report - John Sieber, NIST
Sustainable Development - Tim McGrady, IMR Test Labs
Cast Iron PM Spectrometer Standards - Tony Thoma, Wescast Ind. & Paul Dalager, ARMI
A Traceability Tool - John Sieber, NIST
Traceability, Validation, & Uncertainty in Quantitative XRF - John Sieber, NIST
What's all the fuss about MicroNebulizers? - Geoff Coleman, MGP
Chemical Analysis Methods for P/M Products - Tim McGrady, IMR Test Labs
Comments about ASTM E01 @ NIST - John Sieber, NIST & Dan Geist, ARMI
Testing Tips for Lead-Free Alloys & CRM Status - Juris Sarins, SIPI Metals
Critique of ARMI's process of value assignment - Tim Benner, Carpenter Technologies
The ILAP '03 Conference was held July 30 - August 2, 2003 at The Charter at Beaver Creek, CO.
ILAP '03 Presentations
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